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authorLinus Torvalds <torvalds@ppc970.osdl.org>2005-04-16 15:20:36 -0700
committerLinus Torvalds <torvalds@ppc970.osdl.org>2005-04-16 15:20:36 -0700
commit1da177e4c3f41524e886b7f1b8a0c1fc7321cac2 (patch)
tree0bba044c4ce775e45a88a51686b5d9f90697ea9d /include/asm-sparc64/estate.h
Linux-2.6.12-rc2v2.6.12-rc2
Initial git repository build. I'm not bothering with the full history, even though we have it. We can create a separate "historical" git archive of that later if we want to, and in the meantime it's about 3.2GB when imported into git - space that would just make the early git days unnecessarily complicated, when we don't have a lot of good infrastructure for it. Let it rip!
Diffstat (limited to 'include/asm-sparc64/estate.h')
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1 files changed, 50 insertions, 0 deletions
diff --git a/include/asm-sparc64/estate.h b/include/asm-sparc64/estate.h
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+++ b/include/asm-sparc64/estate.h
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+/* $Id: estate.h,v 1.1 2001/03/28 10:56:34 davem Exp $ */
+#ifndef _SPARC64_ESTATE_H
+#define _SPARC64_ESTATE_H
+
+/* UltraSPARC-III E-cache Error Enable */
+#define ESTATE_ERROR_FMT 0x0000000000040000 /* Force MTAG ECC */
+#define ESTATE_ERROR_FMESS 0x000000000003c000 /* Forced MTAG ECC val */
+#define ESTATE_ERROR_FMD 0x0000000000002000 /* Force DATA ECC */
+#define ESTATE_ERROR_FDECC 0x0000000000001ff0 /* Forced DATA ECC val */
+#define ESTATE_ERROR_UCEEN 0x0000000000000008 /* See below */
+#define ESTATE_ERROR_NCEEN 0x0000000000000002 /* See below */
+#define ESTATE_ERROR_CEEN 0x0000000000000001 /* See below */
+
+/* UCEEN enables the fast_ECC_error trap for: 1) software correctable E-cache
+ * errors 2) uncorrectable E-cache errors. Such events only occur on reads
+ * of the E-cache by the local processor for: 1) data loads 2) instruction
+ * fetches 3) atomic operations. Such events _cannot_ occur for: 1) merge
+ * 2) writeback 2) copyout. The AFSR bits associated with these traps are
+ * UCC and UCU.
+ */
+
+/* NCEEN enables instruction_access_error, data_access_error, and ECC_error traps
+ * for uncorrectable ECC errors and system errors.
+ *
+ * Uncorrectable system bus data error or MTAG ECC error, system bus TimeOUT,
+ * or system bus BusERR:
+ * 1) As the result of an instruction fetch, will generate instruction_access_error
+ * 2) As the result of a load etc. will generate data_access_error.
+ * 3) As the result of store merge completion, writeback, or copyout will
+ * generate a disrupting ECC_error trap.
+ * 4) As the result of such errors on instruction vector fetch can generate any
+ * of the 3 trap types.
+ *
+ * The AFSR bits associated with these traps are EMU, EDU, WDU, CPU, IVU, UE,
+ * BERR, and TO.
+ */
+
+/* CEEN enables the ECC_error trap for hardware corrected ECC errors. System bus
+ * reads resulting in a hardware corrected data or MTAG ECC error will generate an
+ * ECC_error disrupting trap with this bit enabled.
+ *
+ * This same trap will also be generated when a hardware corrected ECC error results
+ * during store merge, writeback, and copyout operations.
+ */
+
+/* In general, if the trap enable bits above are disabled the AFSR bits will still
+ * log the events even though the trap will not be generated by the processor.
+ */
+
+#endif /* _SPARC64_ESTATE_H */