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authorLi Jun <B47624@freescale.com>2014-09-27 19:43:08 +0800
committerLi Jun <jun.li@freescale.com>2015-06-01 17:02:17 +0800
commitc5128f9bafaa37a8e63989032372a5ff36dc82c4 (patch)
treef0cbb582cb17e94e2d5e93928c9590a6f9258ccf /include
parent202ce199bd29093d20506a950748acd5323e76fa (diff)
MLK-9637-1 usb: test: define otg_srp_reqd wIndex byte value
This patch adds otg_srp_reqd wIndex high byte value for otg test mode. Acked-by: Peter Chen <peter.chen@freescale.com> Signed-off-by: Li Jun <b47624@freescale.com> (cherry picked from commit 34660f7aa14972630622406b9dbfc7a106d8d15d)
Diffstat (limited to 'include')
-rw-r--r--include/uapi/linux/usb/ch9.h1
1 files changed, 1 insertions, 0 deletions
diff --git a/include/uapi/linux/usb/ch9.h b/include/uapi/linux/usb/ch9.h
index c1856f3b5158..5a5cada773d2 100644
--- a/include/uapi/linux/usb/ch9.h
+++ b/include/uapi/linux/usb/ch9.h
@@ -135,6 +135,7 @@
#define TEST_SE0_NAK 3
#define TEST_PACKET 4
#define TEST_FORCE_EN 5
+#define TEST_OTG_SRP_REQD 6
/*
* New Feature Selectors as added by USB 3.0