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-rw-r--r--Documentation/ABI/testing/sysfs-class-mtd7
1 files changed, 5 insertions, 2 deletions
diff --git a/Documentation/ABI/testing/sysfs-class-mtd b/Documentation/ABI/testing/sysfs-class-mtd
index 78835080856a..db1ad7e34fc3 100644
--- a/Documentation/ABI/testing/sysfs-class-mtd
+++ b/Documentation/ABI/testing/sysfs-class-mtd
@@ -167,7 +167,10 @@ Description:
block degradation, but high enough to avoid the consequences of
a persistent return value of -EUCLEAN on devices where sticky
bitflips occur. Note that if bitflip_threshold exceeds
- ecc_strength, -EUCLEAN is never returned by the read functions.
+ ecc_strength, -EUCLEAN is never returned by mtd_read().
+ Conversely, if bitflip_threshold is zero, -EUCLEAN is always
+ returned, absent a hard error.
This is generally applicable only to NAND flash devices with ECC
- capability. It is ignored on devices lacking ECC capability.
+ capability. It is ignored on devices lacking ECC capability;
+ i.e., devices for which ecc_strength is zero.